![High frequency measurement facility High frequency measurement facility](/en/customers/measurement-services/high-frequency-measurement-facilities/jcr:content/contentPar/sectioncomponent/sectionParsys/textwithinlinedimage/imageComponent1/image.img.jpg/1631797308098/hochfrequenz-messsysteme.jpg)
Fraunhofer IAF features a variety of advanced high frequency measurement systems for the characterization of integrated circuits and high frequency modules.
![Cryogenic measuring station](/en/customers/measurement-services/high-frequency-measurement-facilities/jcr:content/contentPar/sectioncomponent/sectionParsys/textwithinlinedimage/imageComponent2/image.img.jpg/1631797308098/KryoMessplatz.jpg)
Cryogenic measuring station at Fraunhofer IAF
Fraunhofer IAF features a variety of advanced measurement systems for the characterization of integrated circuits and high frequency modules; e. g. low-noise and power amplifiers, mixers, frequency multipliers, oscillators, switches, and phase shifters. The following measurement facilities are available:
- S-parameters up to 1.1 THz
- Load-pull up to 110 GHz
- Noise parameters up to 50 GHz
- Noise figure up to 750 GHz
- Power up to 300 GHz
- Intermodulation up to 50 GHz