Fraunhofer Institute for Applied Solid State Physics IAF
Fraunhofer Institute for Applied Solid State Physics IAF

High frequency measurement facilities

High frequency measurement facility
© Fraunhofer IAF
Fraunhofer IAF features a variety of advanced high frequency measurement systems for the characterization of integrated circuits and high frequency modules.
© Fraunhofer IAF
Cryogenic measuring station at Fraunhofer IAF

 

Fraunhofer IAF features a variety of advanced measurement systems for the characterization of integrated circuits and high frequency modules; e. g. low-noise and power amplifiers, mixers, frequency multipliers, oscillators, switches, and phase shifters. The following measurement facilities are available:

  • S-parameters up to 1.1 THz
  • Load-pull up to 110 GHz
  • Noise parameters up to 50 GHz
  • Noise figure up to 750 GHz
  • Power up to 300 GHz
  • Intermodulation up to 50 GHz

 

Overview of our high-frequency measurement services

Measurement Type On-Wafer Coaxial Waveguide Measurement possibilities
CW and Pulsed DC sweep Measurements x x   DC Measurements up to 1000 V and 100 A
2 Port S-Parameter x x x - Frequency range up to 1.1 THz
- DC-bias with max. 6 Sources
- Thermal control for On-wafer measurements < 150 GHz
- Wafermap possible
- Broadband measurements from 10 MHz to 220 GHz
- Band limited measurements for frequencies > 220 GHz
4 Port S-Parameter x x   Frequency range 10 MHz up tp 67 GHz
Pulsed S-Parameter x x   Frequency range up to 50 GHz
Noise Figure (NF50) x x x - Frequency range up to 205 GHz
- DC-bias with max. 6 Sources
- Thermal Waferchuck -40 to 200 °C 
- Wafermap possible
Noise Parameter (Nfmin, NF50, Gammaopt, Rn) x x   Frequency range 0.8 GHz up to
50 GHz CW
Power Measurements including harmonics (Pout, Gain, PAE) frequency converting devices Receiver, Transmitter Intermodulation (IMD) x x x - Frequency range up to 330 GHz
- DC-bias with max. 6 Sources
- Thermal control for On-wafer measurements
- Wafermap possible
Harmonic Loadpull up to 40 GHz x x   - CW or pulsed
- 1 or 2 harmonics
mmWave Loadpull x   x e.g. 200 mW @ 94 GHz
Generation and Measurement of Modulated Signals x x   - Arbitrary waveform generation up to 64 Gb/s
- Signal Measurement with up to 160 GS/s, 65 GHz
Measurements In Cryogenic Chamber  x x   - Chamber Temperature down to 4 K
- Sparameter and Noise measurements up to 50 GHz
- DC measurements