Fraunhofer Institute for Applied Solid State Physics IAFAt this year's European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Dr. Michael Dammann from Fraunhofer IAF received the Best Paper Award.
ESREF 2024: Best Paper Award goes to Michael Dammann
10/15/2024 European Symposium on Reliability of Electron Devices, Failure Physics and Analysis 2024
Dr. Michael Dammann, researcher at Fraunhofer IAF in the field of characterization and reliability, received the Best Paper Award of ESREF 2024.
About the ESREF
The 35th edition of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) was held in Parma, Italy from September 23 to 26. As a leading international conference, ESREF focuses on the latest research developments and future issues in failure analysis, quality and reliability of materials, devices and circuits for microelectronics, optoelectronics, power electronics, space and automotive electronics. The event provides a forum for participants from academia and industry to exchange views on all aspects of reliability for current and future semiconductor applications.