Fraunhofer Institute for Applied Solid State Physics IAF
Using an automated cryogenic on-wafer prober, researchers in the “KryproPlus” project will statistically measure qubits on 8-inch and 12-inch wafers at below 2 K for the first time in Europe.
As part of the “KryoproPlus” project, researchers at Fraunhofer IAF are using a novel automatic on-wafer prober to statistically measure the variance of semiconductor qubits on 8-inch and 12-inch wafers at less than 2 Kelvin for the first time in Europe. The data that will be generated form a solid basis for a more accurate assessment of the advantages and disadvantages of different qubit technologies, assist in effectively improving the homogeneity of qubits and thus enable their scaling. This way, Fraunhofer IAF contributes to the establishment of a European value chain of industrially-ready quantum computers with its know-how in cryogenic metrology, semiconductor characterization as well as solid-state-based quantum technologies.
